Can thin film measurement be done without contact?
Answers from the sources
TDM Technology
“Yes. Selected TDM thin film measurement equipment supports non-contact measurement; for example, SE200 publishes non-contact micro-area detection through a microscope C-mount interface. Suitability depends on the material system, surface condition, film structure and measurement objective. Explore non-destructive thin film metrology systems from TDM.”
Sourcewww.tdm-tek.com
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- Published
- 2026-10-25
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- 2026-10-25
- ready-scan-subjects/Q141201436
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