{"schemaVersion":"ready-scan.discovery-surface.v1","id":"urn:readyscan:corpus:evidence:tdm-technology-q141201436","key":"evidence:tdm-technology-q141201436","kind":"evidence","slug":"tdm-technology-q141201436","canonicalUrl":"https://directory.readyscan.ai/corpus/evidence/tdm-technology-q141201436","machineUrl":"https://directory.readyscan.ai/discovery/corpus/evidence/tdm-technology-q141201436.json","datePublished":"2026-09-26","dateModified":"2026-10-25","materialFingerprint":"fnv1a64:0d27d3797f8e61e7","membershipFingerprint":"fnv1a64:715035fc0fb4ae7b","relatedEntitySlugs":["tdm-technology-q141201436"],"relatedSurfaceKeys":["buyer_question:tdm-technology-q141201436-answer-3f46cfd71fe888df0f2e","buyer_question:tdm-technology-q141201436-answer-5e2be4662e0cb24886a1","buyer_question:tdm-technology-q141201436-answer-61573f02f9af15f1cbe2","buyer_question:tdm-technology-q141201436-answer-7b734351b12bc6863aa5","buyer_question:tdm-technology-q141201436-answer-abe2d0ceb592b49b6ffa","buyer_question:tdm-technology-q141201436-answer-b6c35c3d3fee41ff6d81","buyer_question:tdm-technology-q141201436-answer-cb52894b2d8de7b9d313","buyer_question:tdm-technology-q141201436-answer-d35a07c096785608456f","buyer_question:tdm-technology-q141201436-answer-d3d923d036e2649cd353","relationship:tdm-technology-q141201436-products-and-services"],"sourceIds":["ready-scan-subjects"],"provenance":[{"snapshotId":"tdm-technology-q141201436-content-aedcbaa3289e92e1-snapshot","sourceId":"ready-scan-subjects","sourceRecordId":"Q141201436","sourceRevisionId":"Q141201436:content:d15ce3b7bb918777","sourceContentHash":"fnv1a64:db415675499dc6f0","recordRevisionId":"Q141201436:content:d15ce3b7bb918777","recordContentHash":"fnv1a64:16d5f0fc7eaca614","sourceCanonicalUrl":"https://www.tdm-tek.com/","sourceModifiedAt":"2026-10-25T18:26:01.756Z","observedOn":"2026-10-25","permission":{"basis":"public_information","evidenceUrl":"https://www.tdm-tek.com/"},"attributionUrl":"https://www.tdm-tek.com/"}],"quality":{"method":"same_kind_unique_trigram_floor","minimumUniqueTrigramRatio":0.3,"status":"passed"},"title":"TDM Technology — company guide","summary":"TDM Technology: “TDM Technology (legal name: Suzhou TDM Technology Co., Ltd.) is a thin film metrology equipment company founded in 2024 and headquartered in Suzhou, China, with a Shenzhen branch. Regional partners include TECHCESS SOLUTIONS LLC (US), JKY Business Solutions GmbH (Germany), X&X TECHNOLOGY LTD (UK) and 昌富産業株式会社 (Japan) for marketing and after-sales support.”","facts":[{"id":"content-native-digital-agencies-56fb6998e28a181f-a-6ee58fd2dc4d2b71e4b6","label":"TDM Technology","value":"“TDM Technology (legal name: Suzhou TDM Technology Co., Ltd.) is a thin film metrology equipment company founded in 2024 and headquartered in Suzhou, China, with a Shenzhen branch. Regional partners include TECHCESS SOLUTIONS LLC (US), JKY Business Solutions GmbH (Germany), X&X TECHNOLOGY LTD (UK) and 昌富産業株式会社 (Japan) for marketing and after-sales support.”","sourceUrls":["https://www.tdm-tek.com/"]},{"id":"content-native-digital-agencies-56fb6998e28a181f-a-61573f02f9af15f1cbe2","label":"How is thin film thickness measured?","value":"“Thin film thickness is measured with optical and imaging configurations matched to the film stack, substrate and required output. TDM thin film measurement equipment covers published offline, inline and in-situ configurations.”","sourceUrls":["https://www.tdm-tek.com/"]},{"id":"content-native-digital-agencies-56fb6998e28a181f-a-d35a07c096785608456f","label":"What is the difference between inline and in-situ measurement?","value":"“Inline measurement is performed at a defined point in the production flow, typically after a process step or between process steps. In-situ measurement monitors the film at the active coating process. TDM provides coating-head wet-film thickness and reflectance monitoring with SE31/SE310, plus wide-band transmission/reflection optical-film monitoring with SE31-FM. Explore in-situ metrology solutions.”","sourceUrls":["https://www.tdm-tek.com/"]},{"id":"content-native-digital-agencies-56fb6998e28a181f-a-d3d923d036e2649cd353","label":"Can thin film measurement be done without contact?","value":"“Yes. Selected TDM thin film measurement equipment supports non-contact measurement; for example, SE200 publishes non-contact micro-area detection through a microscope C-mount interface. Suitability depends on the material system, surface condition, film structure and measurement objective. Explore non-destructive thin film metrology systems from TDM.”","sourceUrls":["https://www.tdm-tek.com/"]},{"id":"content-native-digital-agencies-56fb6998e28a181f-a-cb52894b2d8de7b9d313","label":"What is thin film metrology?","value":"“Thin film metrology is the measurement and analysis of thin film thickness, optical constants, and layer uniformity. It uses non-destructive optical methods to verify whether a deposited film matches process specifications, so manufacturers can control coating quality and yield without damaging the sample.”","sourceUrls":["https://www.tdm-tek.com/faq"]},{"id":"content-native-digital-agencies-56fb6998e28a181f-a-abe2d0ceb592b49b6ffa","label":"What is the difference between offline, inline, and in-situ inspection?","value":"“TDM Technology uses Offline, Inline and In-situ as its standard configuration terms. Offline inspection measures sampled substrates on benchtop equipment in a laboratory, typically for R&D and incoming material checks.”","sourceUrls":["https://www.tdm-tek.com/faq"]},{"id":"content-native-digital-agencies-56fb6998e28a181f-a-5e2be4662e0cb24886a1","label":"Which industries can benefit from thin film metrology equipment?","value":"“TDM Technology thin film metrology equipment is used in the photovoltaic industry, semiconductor wafer manufacturing, display panels, consumer electronics, food and pharmaceutical packaging, and precision optical components. Any process that deposits a functional coating and needs thickness or uniformity control can apply it.”","sourceUrls":["https://www.tdm-tek.com/faq"]},{"id":"content-native-digital-agencies-56fb6998e28a181f-a-b6c35c3d3fee41ff6d81","label":"How do TDM products measure film thickness?","value":"“The published TDM portfolio uses model-specific optical configurations. SE100 provides point measurement over 5–1200 nm; SE200 provides micro-area optical measurement over 4 nm–450 µm; SE600X provides inline perovskite measurement over 5–1200 nm; SE31 and SE310 monitor slot-die wet films; and SE31-FM provides wide-band transmission/reflection optical-film monitoring.”","sourceUrls":["https://www.tdm-tek.com/products/film-thickness-measurement"]},{"id":"content-native-digital-agencies-56fb6998e28a181f-a-7b734351b12bc6863aa5","label":"Which TDM model has the widest published film-thickness range?","value":"“SE200 publishes the widest numerical range among the current product pages: 4 nm–450 µm. Its repeatability is ≤0.02 nm, absolute accuracy is 0.2% or 1 nm, and selectable spot size is 1–100 µm.”","sourceUrls":["https://www.tdm-tek.com/products/film-thickness-measurement"]},{"id":"content-native-digital-agencies-56fb6998e28a181f-a-3f46cfd71fe888df0f2e","label":"Which model supports offline point measurement with optical-property outputs?","value":"“SE100 measures 5–1200 nm films using point sampling and publishes thickness, reflectance, transmittance, n, k, band gap and PL outputs. Published repeatability is ≤ ±1%, with sample sizes from 10 × 10 to 220 × 220 mm.”","sourceUrls":["https://www.tdm-tek.com/products/film-thickness-measurement"]},{"id":"content-native-digital-agencies-56fb6998e28a181f-a-70b0a40febfbc80235c6","label":"In-situ Film Thickness Monitoring","value":"“Compare SE31/SE310 coating-head slot-die wet-film thickness and reflectance modules with the separate SE31-FM wide-band T/R optical-film monitoring route.”","sourceUrls":["https://www.tdm-tek.com/products/in-situ"]},{"id":"content-native-digital-agencies-56fb6998e28a181f-a-4e27ec89fd7d23b1c82c","label":"SE31 Slot Die Wet Film Metrology Module","value":"“Mounted on coating head with SDK integration.”","sourceUrls":["https://www.tdm-tek.com/products/in-situ"]},{"id":"content-native-digital-agencies-56fb6998e28a181f-a-de4cccded46104839ce5","label":"SE310 Slot Die Wet Film Metrology Module","value":"“Mounted on coating head with SDK integration.”","sourceUrls":["https://www.tdm-tek.com/products/in-situ"]},{"id":"content-native-digital-agencies-56fb6998e28a181f-a-9452aa9450b73ec2b04c","label":"SE31-FM Wide Band Dual-Use Optical Film Thickness Monitor","value":"“SE31-FM Wide Band Dual-Use Optical Film Thickness Monitor”","sourceUrls":["https://www.tdm-tek.com/products/in-situ"]}]}